12/7/2023 0 Comments X ray diffraction pattern assign![]() The Journal of Physical Chemistry B, 124, 6278-6287. (2020) Oligo (L-Glutamic Acids) in Calcium Phosphate Precipitation: Chain length effect. Ustriyana, P., Harmon, E., Chen, K., Michel, F.These findings are an important step towards understanding how biological systems can control mineralization processes and will improve the design of biomimetic mineralized materials for biomedical applications. Based on these results the study also proposed a specific mechanism to explain the effect of organic molecule chain length. The results of this two-part investigation showed how organic additives influence the size of the amorphous calcium phosphate and the kinetics of its crystallization. The experiments used a suite of complementary characterization methods including two x-ray scattering techniques made possible through collaboration with NanoEarth scientists. The experiments involved synthesizing amorphous calcium phosphate in the presence of different length peptides and observing its transformation to crystalline hydroxylapatite. This research examined the effects of model organic molecules on the formation of and transformation of calcium phosphates. Biomineralization of calcium phosphates is complex due to the effects of biomacromolecules such as proteins. Minimum film thickness for phase identification: ~2 nmĮffects of Biomacromolecules on Calcium Phosphate Formation and Transformation: Calcium phosphates are the main inorganic mineral component of bones and teeth and are of interest in fields ranging from bioengineering to Earth science.Detection Limits: Quantitative multiphase analysis: ~1%.All elements, assuming they are present in a crystalline matrix (lightest elements e.g., hydrogen likely not detectable).Anode Types Available (sealed high-resolution x-ray tubes).Proportional detector (Cu radiation only).Galipix 3D area detector with CdTe sensor (suitable for Cu and Ag radiation).Signal Detected: Diffraction and scattering (elastic).We also have incident and diffracted optics for each type of experiment. Our system is also equipped with following a sample changer for pXRD, a vacuum chamber for SAXS/WAXS, a silver (Ag) x-ray source and capillary spinner for PDF, and a motorized X,Y,Z stage for XRR and GI-XRD. Total scattering for pair distribution function (PDF) analysis.Grazing-incidence x-ray diffraction (GI-XRD).Small-angle x-ray scattering (SAXS) and wide-angle x-ray scattering (WAXS).High-resolution powder x-ray diffraction (pXRD).The Empyrean Nano Edition is a multipurpose X-ray diffraction platform equipped to perform a wide range of x-ray scattering measurements including: Panalytical Empyrean Multipurpose Diffractometer Wet samples/suspensions (except high solid:liquid ratio).Identification of amorphous solids (requires suitable references/standards).*Other sample types may be possible - inquire with questions. Measuring sub-milligram loose powder or dried solution samples for phase identification.Detecting minor crystalline phases (at concentrations greater than ~1%).Determination of the ratio or percentage of crystalline to amorphous material in bulk materials and thin-films.Measurement of average crystallite size, strain, or micro-strain effects.Identification/quantification of crystalline and amorphous phases.Natural and synthetic samples as powders, pressed pellets, single- and multi-layer thin films, and more*.Other X-ray scattering methods include small-angle X-ray scattering (SAXS), wide-angle X-ray scattering (WAXS), grazing-incidence XRD, X-ray reflectivity, and total scattering for pair distribution function (PDF) analysis. This method is quantitative and requires minimal or no sample preparation. Comparing a sample’s XRD pattern to a database of known structures enables the phase identification of a large variety of crystalline and nanocrystalline samples. Consequently, the X-ray diffraction pattern is the fingerprint of the periodic atomic arrangements in a given material. The peak intensities are determined by the distribution of atoms within the lattice. The peaks in a powder XRD pattern are produced by constructive interference of a monochromatic beam of X-rays diffracted at specific angles from each set of lattice planes in a sample. Powder XRD provides information on crystal structure, phase identity, preferred crystal orientation (texture), and other structural parameters, such as average grain/crystallite size, lattie strain, and crystal defects. The most commonly used scattering method is X-ray diffraction (XRD). X-ray scattering techniques are powerful and nondestructive methods for examining the atomic structural and physical characteristics of crystalline and noncrystalline materials.
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